【英文标准名称】:CertificationofRuptureDiskDeviceWithNoOutletConnectionSectionVIII,Division1SUPP8&9
【原文标准名称】:无输出连接的安全膜设备的证书.第VIII节,第1部分补充件8&9
【标准号】:ASME2395-2001
【标准状态】:现行
【国别】:美国
【发布日期】:2001
【实施或试行日期】:
【发布单位】:美国机械工程师协会(US-ASME)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:
【摘要】:CertificationofRuptureDiskDeviceWithNoOutletConnectionSectionVIII,Division1SUPP8&9
【中国标准分类号】:J98
【国际标准分类号】:
【页数】:
【正文语种】:英语
【英文标准名称】:Dimensionsforthemountingofsingle-hole,bush-mounted,spindle-operatedelectroniccomponents
【原文标准名称】:单孔、轴套安装、轴操动的电子元件的安装尺寸
【标准号】:IEC60620-1984
【标准状态】:作废
【国别】:国际
【发布日期】:1984
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC23J
【标准类型】:()
【标准水平】:()
【中文主题词】:单孔安装;尺寸;电气工程;电子设备及元件;电子设备;架设(施工作业)
【英文主题词】:Dimensions;Electricalengineering;Electronicequipment;Electronicequipmentandcomponents;Erecting(constructionoperation);Single-holemountings;Sockets(threaded);Threads
【摘要】:Specifiesmountingdimensionsforspindle-operated,single-holecomponentsincludingswitches,potentiometersandvariablecapacitorsprimarilyintendedforuseinequipmentfortelecommunicationsandinelectronicdevicesemployingsimilartechniques.A
【中国标准分类号】:L10
【国际标准分类号】:31_240
【页数】:27P.;A4
【正文语种】:英语
MIL-PRF-123D, PERFORMANCE SPECIFICATION, CAPACITORS, FIXED, CERAMIC DIELECTRIC, (TEMPERATURE STABLE AND GENERAL PURPOSE), HIGH RELIABILITY, GENERAL SPECIFICATION FOR (28 SEP 2007) [SUPERSEDING MIL-C-123A]., This specification covers the general requirements for high reliability, general purpose (BX and BR) and temperature stable (BP and BG) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required (BP and BG), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated (BX and BR). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.